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X-ray photoelectron spectroscopy sample preparation requirements

X-ray photoelectron spectroscopy sample preparation requirements, Total:23 items.

In the international standard classification, X-ray photoelectron spectroscopy sample preparation requirements involves: Electronic components in general, Analytical chemistry, Electricity. Magnetism. Electrical and magnetic measurements, Physics. Chemistry, Medical equipment.

Professional Standard - Electron, X-ray photoelectron spectroscopy sample preparation requirements

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

International Organization for Standardization (ISO), X-ray photoelectron spectroscopy sample preparation requirements

ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser

国家市场监督管理总局、中国国家标准化管理委员会, X-ray photoelectron spectroscopy sample preparation requirements

GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

British Standards Institution (BSI), X-ray photoelectron spectroscopy sample preparation requirements

BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
IEC 62607-6-21:2022 Nanomanufacturing. Key control characteristics. - Part 6-21: Graphene-based material. Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
BS EN 60601-2-68:2015 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam therapy equi

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray photoelectron spectroscopy sample preparation requirements

GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray photoelectron spectroscopy sample preparation requirements

GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

American Society for Testing and Materials (ASTM), X-ray photoelectron spectroscopy sample preparation requirements

ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

Korean Agency for Technology and Standards (KATS), X-ray photoelectron spectroscopy sample preparation requirements

KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer

Standard Association of Australia （SAA）, X-ray photoelectron spectroscopy sample preparation requirements

AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser

Association Francaise de Normalisation, X-ray photoelectron spectroscopy sample preparation requirements

NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.

International Electrotechnical Commission (IEC), X-ray photoelectron spectroscopy sample preparation requirements

IEC TS 62607-6-21:2022 Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy