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x-ray single crystal

x-ray single crystal, Total:15 items.

In the international standard classification, x-ray single crystal involves: Ceramics, Semiconducting materials, Education, Testing of metals, Analytical chemistry.

National Metrological Technical Specifications of the People's Republic of China, x-ray single crystal

• JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

International Organization for Standardization (ISO), x-ray single crystal

• ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
• ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
• ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

British Standards Institution (BSI), x-ray single crystal

• BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
• 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

Group Standards of the People's Republic of China, x-ray single crystal

• T/IAWBS 017-2022 Test method for full width at half maximum of double crystal X-rayrocking curve of diamond single crystal substrate
• T/IAWBS 015-2021 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate
• T/IAWBS 016-2022 X-ray double crystal rocking curve FWHM test method for silicon carbide single wafer

Professional Standard - Education, x-ray single crystal

• JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
• JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray single crystal

• GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
• GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal

German Institute for Standardization, x-ray single crystal

• DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction

Professional Standard - Aviation, x-ray single crystal

• HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography

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