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X-ray single crystal orientation instrument

X-ray single crystal orientation instrument, Total:25 items.

In the international standard classification, X-ray single crystal orientation instrument involves: Optics and optical measurements, Analytical chemistry, Products of the chemical industry, Production of metals, Testing of metals, Education, Semiconducting materials, Ceramics, Ferrous metals, Inorganic chemicals.

National Metrological Technical Specifications of the People's Republic of China, X-ray single crystal orientation instrument

• JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

Professional Standard - Machinery, X-ray single crystal orientation instrument

• JB/T 5482-2011 X-ray orientation apparatus
• JB/T 5482-2004 Technical conditions of X-ray crystal orientation instrument

国家市场监督管理总局、中国国家标准化管理委员会, X-ray single crystal orientation instrument

• GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

Professional Standard - Aviation, X-ray single crystal orientation instrument

• HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography

National Metrological Verification Regulations of the People's Republic of China, X-ray single crystal orientation instrument

• JJG 629-2014 Polycrystalline X-Ray Diffractometers
• JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
• JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer

机械电子工业部, X-ray single crystal orientation instrument

• JB/T 5982-1991 X-ray directional instrument technical conditions

Japanese Industrial Standards Committee (JISC), X-ray single crystal orientation instrument

• JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

Professional Standard - Education, X-ray single crystal orientation instrument

• JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
• JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

American Society for Testing and Materials (ASTM), X-ray single crystal orientation instrument

• ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
• ASTM E975-03 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
• ASTM E975-03(2008) Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
• ASTM E975-00 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
• ASTM E975-13 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
• ASTM E975-22 Standard Test Method for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation

Professional Standard - Commodity Inspection, X-ray single crystal orientation instrument

• SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels.X-ray diffraction(XRD)

International Organization for Standardization (ISO), X-ray single crystal orientation instrument

• ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

British Standards Institution (BSI), X-ray single crystal orientation instrument

• BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
• 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

German Institute for Standardization, X-ray single crystal orientation instrument

• DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray single crystal orientation instrument

• GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer

KR-KS, X-ray single crystal orientation instrument

• KS D ISO 14706-2003(2023)

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