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SEM Optics

SEM Optics, Total:338 items.

In the international standard classification, SEM Optics involves: Vocabularies, Optical equipment, Non-ferrous metals, Linear and angular measurements, Air quality, Thermodynamics and temperature measurements, Optics and optical measurements, Electronic display devices, Textile fibres, Analytical chemistry, Education, Surface treatment and coating, Medical equipment, Protection against crime, Paints and varnishes, Testing of metals, Optoelectronics. Laser equipment, Construction materials, Cinematography, Medical sciences and health care facilities in general, Electrical engineering in general, Power transmission and distribution networks, Physics. Chemistry, Information sciences. Publishing, Character sets and information coding, Iron and steel products, Ceramics, Fishing and fish breeding, Applications of information technology, Transport, Semiconductor devices, Integrated circuits. Microelectronics, Fuels, Paint ingredients, Photography, Products of the textile industry.


Professional Standard - Commodity Inspection, SEM Optics

  • SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
  • SN/T 3009-2011 Identification of seawater corrosion on metallic surface by SEM
  • SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

Korean Agency for Technology and Standards (KATS), SEM Optics

Japanese Industrial Standards Committee (JISC), SEM Optics

  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
  • JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
  • JIS B 7208:1972 16 mm motion picture scanning-beam illumination uniformity test films
  • JIS B 7207:1972 35 mm motion picture scanning-beam illumination uniformity test films, service type
  • JIS B 7206:1972 35 mm motion picture scanning-beam illumination uniformity test films, laboratory type
  • JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
  • JIS B 7287-2:2017 Ophthalmic optics -- Spectacle frames and sunglasses electronic catalogue and identification -- Part 2: Commercial information
  • JIS B 7287-3:2017 Ophthalmic optics -- Spectacle frames and sunglasses electronic catalogue and identification -- Part 3: Technical information

American Society for Testing and Materials (ASTM), SEM Optics

  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
  • ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
  • ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
  • ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
  • ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
  • ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
  • ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
  • ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
  • ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
  • ASTM E3284-23 Standard Practice for Training in the Forensic Examination of Primer Gunshot Residue (pGSR) Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
  • ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
  • ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
  • ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
  • ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry

International Organization for Standardization (ISO), SEM Optics

  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
  • ISO/CD 16971-1 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
  • ISO/DIS 16971-1:2011 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
  • ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
  • ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • ISO 17123-9:2018 Optics and optical instruments — Field procedures for testing geodetic and surveying instruments — Part 9: Terrestrial laser scanners
  • ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
  • ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
  • ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
  • ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
  • ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
  • ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
  • ISO 10685-2:2016 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information
  • ISO 10685-3:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3: Technical information
  • ISO 10685-2:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information
  • ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • ISO/FDIS 17751-2 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
  • ISO 21915-1:2020 Textiles — Qualitative and quantitative analysis of some cellulose fibres (lyocell, cupro) and their blends — Part 1: Fibre identification using scanning electron microscopy and spectral analysis meth
  • ISO 17751-2:2014 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
  • ISO 17751-2:2023 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
  • ISO 22581:2021 Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containi

Group Standards of the People's Republic of China, SEM Optics

  • T/QGCML 1940-2023
  • T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
  • T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
  • T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
  • T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
  • T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
  • T/CEC 616-2022 Technical Specifications for Laser Scanning Flying Robots for Power Transmission Lines
  • T/CEC 448-2021 Technical regulations for unmanned aerial vehicle laser scanning operation of overhead transmission lines
  • T/CES 183-2022 Specification of the data collection by fixed wing unmanned aerial vehicle laser scanning for overhead tranmission line
  • T/TIAA 014-2018 Optical measuring methods of display devices for Vehicle electronic rearview mirror

National Metrological Technical Specifications of the People's Republic of China, SEM Optics

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
  • JJF 1951-2021 Calibration Specification for Optical 3D Measuring Systems Based on Structured Light Scanning

Professional Standard - Machinery, SEM Optics

  • JB/T 6842-1993 Test method of scanning electron microscope
  • JB/T 5384-1991 Scanning electron microscope - Technical specification
  • JB/T 5478-1991 Manual scanning photoelectric direct-reading spectrometer
  • JB/T 7503-1994 Thickness of cross section of metal coatings Scanning electron microscope measuring method

National Metrological Verification Regulations of the People's Republic of China, SEM Optics

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, SEM Optics

  • GB/T 36422-2018 Man-made fiber.Test method for micro morphology and diameter.Scanning electron microscope method
  • GB/T 16594-1996 Micron grade lenght measurement by SEM
  • GB/T 31563-2015 Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
  • GB/T 17722-1999 Gold-plated thickness measurement by SEM
  • GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
  • GB/T 20307-2006 General rules for nanometer-scale length measurement by SEM
  • GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
  • GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
  • GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification
  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel.Scanning electron microscope
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
  • GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
  • GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
  • GB/T 14593-2008 Quantitative analysis method of cashmere,wool and their blends.Scanning electron microscope method
  • GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
  • GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
  • GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
  • GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
  • GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
  • GB/T 40905.2-2022 Textiles—Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends—Part 2: Scanning electron microscopy method

British Standards Institution (BSI), SEM Optics

  • BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
  • BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
  • BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
  • BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS ISO 17123-9:2018 Optics and optical instruments. Field procedures for testing geodetic and surveying instruments - Terrestrial laser scanners
  • BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS IEC 62906-5-5:2022 Laser displays - Optical measuring methods of raster-scanning retina direct projection laser displays
  • BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
  • BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
  • BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • 12/30265696 DC BS ISO 18115-2 AMD1. Surface chemical analysis. Vocabulary. Part 2. Terms used in scanning-probe microscopy
  • 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
  • BS EN ISO 11715-1:1998 Ophthalmic optics - Format of digital data files for data transfer for profiling of spectacle lenses - Two-dimensional tracers
  • BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
  • 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
  • 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • PD IEC/TR 61948-3:2018 Tracked Changes. Nuclear medicine instrumentation. Routine tests. Positron emission tomographs
  • BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
  • 21/30432306 DC BS EN IEC 62906-5-5. Laser displays. Part 5-5. Optical measuring methods of raster-scanning retina direct projection laser displays
  • 20/30423331 DC BS EN IEC 62906-5-5. Laser displays. Part 5-5. Optical measuring methods of raster-scanning retina direct projection laser displays
  • BS EN ISO 10685-2:2016 Ophthalmic optics. Spectacle frames and sunglasses electronic catalogue and identification. Commercial information
  • BS EN ISO 10685-2:2012 Ophthalmic optics. Spectacle frames and sunglasses electronic catalogue and identification. Commercial information
  • BS EN ISO 10685-3:2012 Ophthalmic optics. Spectacle frames and sunglasses electronic catalogue and identification. Technical information
  • 19/30402600 DC BS IEC 62906-5-5. Laser display devices. Part 5-5. Optical measuring methods of raster-scanning retina direct projection devices
  • 18/30363457 DC BS EN 62906-5-5. Laser display devices. Part 5-5. Optical measuring methods of raster-scanning retina direct projection devices
  • BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
  • BS EN ISO 17751-2:2016 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends. Scanning Electron Microscopy method
  • BS 4793:1972 Recommendations for specifying the optical performance of lenses for television cameras
  • 12/30228339 DC BS ISO 16000-27. Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • PD IEC TR 61948-2:2019 Tracked Changes. Nuclear medicine instrumentation. Routine tests. Scintillation cameras and single photon emission computed tomography imaging
  • BS ISO 11505:2013 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
  • BS EN ISO 10685-1:2011 Ophthalmic optics. Spectacle frames and sunglasses electronic catalogue and identification. Product identification and electronic catalogue product hierarchy

KR-KS, SEM Optics

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS P ISO 16971-2020 Ophthalmic instruments — Optical coherence tomograph for the posterior segment of the human eye
  • KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
  • KS C IEC TR 61948-3-2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
  • KS K ISO 17751-2-2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method

Professional Standard - Education, SEM Optics

  • JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
  • JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy
  • JY/T 010-1996 General principles of analytical scanning electron microscopy

工业和信息化部, SEM Optics

  • SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy
  • YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy

Professional Standard - Public Safety Standards, SEM Optics

  • GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1418-2017 Elemental Composition Examination of Forensic Science Glass Evidence Scanning Electron Microscopy/Energy Spectroscopy
  • GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
  • GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, SEM Optics

  • GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
  • GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

Professional Standard - Petroleum, SEM Optics

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, SEM Optics

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Association of German Mechanical Engineers, SEM Optics

  • VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
  • VDI 3866 Blatt 5-2017 Determination of asbestos in technical products - Scanning electron microscopy method
  • VDI/VDE 2634 Blatt 2-2002 Optical 3D-measuring systems - Optical systems based on area scanning
  • VDI/VDE 2634 Blatt 2-2012 Optical 3-D measuring systems - Optical systems based on area scanning
  • VDI/VDE 2634 Blatt 3-2008 Optical 3D-measuring systems - Multiple view systems based on area scanning
  • VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
  • VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
  • VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method

国家能源局, SEM Optics

  • SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
  • NB/T 35109-2018 Three-dimensional laser scanning measurement procedures for hydropower projects

Guangdong Provincial Standard of the People's Republic of China, SEM Optics

  • DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

Jiangsu Provincial Standard of the People's Republic of China, SEM Optics

  • DB32/T 4546-2023 Technical specifications for automated inspection of diatom images using scanning electron microscopes
  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Judicatory, SEM Optics

Professional Standard - Medicine, SEM Optics

  • YY/T 1895-2023 Intravascular optical coherence tomography imaging device

国家市场监督管理总局、中国国家标准化管理委员会, SEM Optics

  • GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
  • GB/T 38783-2020 Method of coating thickness determination for precious metal composites by scanning electron microscope
  • GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
  • GB/T 35097-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrosmetry—Determination of numberical concentration of inorganic fibrous particles in ambient air

Military Standard of the People's Republic of China-General Armament Department, SEM Optics

  • GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
  • GJB 8381-2015 Combined method of streak photography and laser interferometry for cylinder test of explosives

Association Francaise de Normalisation, SEM Optics

  • NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF S12-130*NF ISO 16971:2015 Ophthalmic instruments - Optical coherence tomograph for the posterior segment of the human eye
  • NF ISO 16971:2015 Instruments ophtalmiques - Tomographe de cohérence optique du segment postérieur de l'oeil humain
  • NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
  • NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
  • NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
  • NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
  • FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)
  • NF S11-560-2:2013 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information
  • NF S11-560-2*NF EN ISO 10685-2:2016 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2 : Commercial information
  • NF X43-404-27*NF ISO 16000-27:2014 Indoor air - Part 27 : determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • NF S11-560-3*NF EN ISO 10685-3:2013 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3 : technical information
  • NF G07-142-2*NF EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other speciality animal fibres and their blends - Part 2 : scanning electron microscopy method
  • NF EN ISO 10685-1:2012 Optique ophtalmique - Catalogue de montures de lunettes et de lunettes de soleil et identification - Partie 1 : identification des produits et hiérarchie des catalogues électroniques

SE-SIS, SEM Optics

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
  • SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

European Committee for Standardization (CEN), SEM Optics

  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
  • EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
  • EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
  • prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
  • EN ISO 10685-3:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3: Technical information (ISO 10685-3:2012)

RU-GOST R, SEM Optics

  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
  • GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
  • GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
  • GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
  • GOST R IEC/TO 61948-2-2008 Nuclear medicine instrumentation. Routine tests. Part 2. Scintillation cameras and single photon emission computed tomography imaging
  • GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
  • GOST R 56123-2014 Medical electrical equipment. Single photon emission computed tomographs. Technical requirements for governmental purchases

Danish Standards Foundation, SEM Optics

  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
  • DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • DS/IEC/TR 61948-3:2006 Nuclear medicine instrumentation - Routine tests - Part 3: Positron emission tomographs
  • DS/EN ISO 10685-3:2013 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3: Technical information
  • DS/EN ISO 10685-2:2013 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information
  • DS/IEC/TR 61948-2:2003 Nuclear medicine instrumentation - Routine tests - Part 2: Scintillation cameras and single photon emission computed tomography imaging

German Institute for Standardization, SEM Optics

  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
  • DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
  • DIN 66223-5:1985 Fonts for optical character recognition; format for handheld scanner
  • DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
  • DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
  • DIN 6855-4:2016-11 Constancy testing of nuclear medicine instruments - Part 4: Positron emission tomographs (PET)
  • DIN EN ISO 10685-3:2013-03 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3: Technical information (ISO 10685-3:2012); German version EN ISO 10685-3:2012
  • DIN EN ISO 17751-2:2016-11 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016); German version EN ISO 17751-2:2016 / Note: To be replaced by DIN EN ISO 17751-2 (2022-09).
  • DIN EN ISO 17751-2:2022-09 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Part 2: Scanning electron microscopy method (ISO/DIS 17751-2:2022); German and English version prEN ISO 17751-2:2022 / Note: Date of issue 2022-08-19*I...

ES-UNE, SEM Optics

  • UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
  • UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
  • UNE-EN ISO 10685-2:2016 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information (ISO 10685-2:2016, Corrected version 2016-05-15)

未注明发布机构, SEM Optics

  • JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
  • BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
  • BS 4793:1972(2011) Recommendations for Specifying the optical performance oflenses for television cameras
  • BS EN ISO 10685-2:2016(2017) Ophthalmic optics — Spectacle frames and sunglasses electronic catalogue and identification Part 2 : Commercial information
  • DIN EN IEC 61675-1:2022 Imaging systems in nuclear medicine – characteristics and test conditions – Part 1: Positron emission tomographs

Association for Information and Image Management (AIIM), SEM Optics

  • AIIM MS52-1991 Recommended Practice for the Requirements and Characteristics of Documents Intended for Optical Scanning

Fujian Provincial Standard of the People's Republic of China, SEM Optics

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, SEM Optics

  • GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

AENOR, SEM Optics

  • UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).

Lithuanian Standards Office , SEM Optics

  • LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

GOSTR, SEM Optics

  • GOST R 58566-2019 Optics and photonics. Lenses for optical electronic systems. Test methods
  • PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

AT-ON, SEM Optics

  • OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

Professional Standard - Electricity, SEM Optics

  • DL/T 1346-2014 Operating code of helicopter laser scanning for transmission line
  • DL/T 1346-2021 Technical regulations for helicopter laser scanning operation of overhead transmission lines

BE-NBN, SEM Optics

  • NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

Professional Standard - Military and Civilian Products, SEM Optics

  • WJ 2299-1995 Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

Professional Standard - Energy, SEM Optics

  • DL/T 2333-2021 Technical regulations for ground three-dimensional laser scanning measurement of power transmission and transformation projects
  • NB/SH/T 0902-2015 Standard test method for measuring n-heptane induced phase separation of asphaltene-containing heavy fuel oil as separability number by an optical scanning device

Shandong Provincial Standard of the People's Republic of China, SEM Optics

  • DB37/T 420.2-2004 Diagnosis protocol for scorpion finger disease in mariculture fish part 2: Scanning electron microscopy diagnostic method

International Electrotechnical Commission (IEC), SEM Optics

  • IEC 62906-5-5:2022 Laser displays – Part 5-5: Optical measuring methods of raster-scanning retina direct projection laser displays

American National Standards Institute (ANSI), SEM Optics

  • ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

Professional Standard - Civil Aviation, SEM Optics

  • MH/T 1064.3-2017 Safety code of power working with the helicopter.Part 3: Laser scanning operation

未注明发布机构, SEM Optics

  • JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
  • BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
  • BS 4793:1972(2011) Recommendations for Specifying the optical performance oflenses for television cameras
  • BS EN ISO 10685-2:2016(2017) Ophthalmic optics — Spectacle frames and sunglasses electronic catalogue and identification Part 2 : Commercial information
  • DIN EN IEC 61675-1:2022 Imaging systems in nuclear medicine – characteristics and test conditions – Part 1: Positron emission tomographs

Professional Standard - Aviation, SEM Optics

  • HB 20094.4-2012 Test method for determination of wear metals in operating liquid for aviation.Part 4: Scanning electron microscopy and energy dispersive spectrometry

Society of Motion Picture and Television Engineers (SMPTE), SEM Optics

  • SMPTE RP 81-2004 Specifications for Scanning-Beam Uniformity Test Film for 16-mm Motion-Picture Photographic Audio Reproducers
  • SMPTE RP 69-2002 Specifications for Scanning-Beam Uniformity Test Film for 35-mm Motion-Picture Audio Reproducers
  • SMPTE RP 81-1994 Specifications for Scanning-Beam Uniformity Test Film for 16-mm Motion-Picture Photographic Audio Reproducers

Professional Standard - Nuclear Industry, SEM Optics

  • EJ/T 20150.23-2018 PWR Rod-Radiation Fuel Assembly Post-Illumination Part 23: SEM Analysis of Fuel Cladding Tubes

Indonesia Standards, SEM Optics

  • SNI IEC/TR 61948-3:2012 Nuclear medicine instrumentation - Routine test - Part 3: Positron emission tomographs
  • SNI IEC/TR 61948-2:2012 Nuclear medicine instrumentation - Routine test - Part 2: Scintillation cameras and single photon emission computed tomography imaging

CEN - European Committee for Standardization, SEM Optics

  • EN ISO 10685-2:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information

PL-PKN, SEM Optics

  • PN T04880-1972 Electronic tubes Oscilloscope and radaroscope tubes Methods of electrical and optical test

IN-BIS, SEM Optics





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