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What are the ellipsometers
What are the ellipsometers, Total:18 items.
In the international standard classification, What are the ellipsometers involves: Machine tools, Metrology and measurement in general, Non-destructive testing, Linear and angular measurements.
Korean Agency for Technology and Standards (KATS), What are the ellipsometers
British Standards Institution (BSI), What are the ellipsometers
German Institute for Standardization, What are the ellipsometers
- DIN EN ISO 23131:2023-01 Ellipsometry - Principles (ISO 23131:2021); German version EN ISO 23131:2022
- DIN EN ISO 23131:2023 Ellipsometry - Principles (ISO 23131:2021)
- DIN 50989-2:2021-04 Ellipsometry - Part 2: Bulk material model; Text in German and English
- DIN 50989-3:2022-04 Ellipsometry - Part 3: Transparent single layer model; Text in German and English
- DIN 50989-6:2023-03 Ellipsometry - Part 6: Effective Materials model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-4:2022-09 Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
- DIN 50989-5:2023-03 Ellipsometry - Part 5: Multiple layers and periodic layers model; Text in German and English / Note: Date of issue 2023-01-27
- DIN 50989-1:2018 Ellipsometry - Part 1: Principles; Text in German and English
Association Francaise de Normalisation, What are the ellipsometers
National Metrological Technical Specifications of the People's Republic of China, What are the ellipsometers
ES-UNE, What are the ellipsometers
International Organization for Standardization (ISO), What are the ellipsometers
- IEC TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
- IEC/TR 63258:2021 Nanotechnologies — A guideline for ellipsometry application to evaluate the thickness of nanoscale films
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, What are the ellipsometers
- GB/T 31225-2014 Test method for the thickness of silicon oxide on Si substrate by ellipsometer